TITLE

Stress impact on dielectric properties of Bi3.15Nd0.85Ti3O12 films

AUTHOR(S)
Yunfei Liu; Yi Kan; Xiaomei Lu; Wei Cai; Xiaobo Wu; Xiumei Wu; Xiaofei Wang; HuiFeng Bo; Fengzhen Huang; Jinsong Zhu
PUB. DATE
February 2010
SOURCE
Applied Physics Letters;2/15/2010, Vol. 96 Issue 7, p072902
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Dielectric properties of Bi3.15Nd0.85Ti3O12 films under applied uniaxial stress were investigated. The results showed that the dielectric constant and loss increased with the stress changing from maximum compression (-70 MPa) to maximum tension (+70 MPa). Further studies discovered that the variation of the dielectric constant under stress was more distinct at higher testing ac field and ambient temperature. These observations were explained based on the domain wall movability related with the stress-induced domain reorientation.
ACCESSION #
48199548

 

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