TITLE

Structural and ferromagnetic resonance characteristics of BaFe[sub 12]O[sub 19] films with minimal linewidths

AUTHOR(S)
Saraf, L. V.; Lofland, S. E.; Cresce, Arthur V.; Bhagat, S. M.; Ramesh, R.
PUB. DATE
July 2001
SOURCE
Applied Physics Letters;7/16/2001, Vol. 79 Issue 3
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Hexagonal barium ferrite films with thickness between 0.3 and 8 μm were deposited on (0001) oriented Al[sub 2]O[sub 3] using pulsed laser deposition and optimized growth and annealing conditions. They were characterized by measurements of x-ray diffraction, Rutherford backscattering, magnetization, atomic force microscopy and ferromagnetic resonance (FMR) at 58 GHz. The narrowest FMR lines and largest number of spin wave resonances are obtained when the field is perpendicular to the film plane of 0.3 and 0.46 μm films. To quantitatively account for variations with field angle (θ) we assume (i) a strain-induced anisotropy energy with cos[sup 4] θ dependence and (ii) that the film should be pictured as a mosaic whose tiles are tilted out of the film plane. © 2001 American Institute of Physics.
ACCESSION #
4812763

 

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