Determination of the microstructure of Eu-treated ZnO nanowires by x-ray absorption

Huang, W. L.; Labis, J.; Ray, S. C.; Liang, Y. R.; Pao, C. W.; Tsai, H. M.; Du, C. H.; Pong, W. F.; Chiou, J. W.; Tsai, M.-H.; Lin, H. J.; Lee, J. F.; Chou, Y. T.; Shen, J. L.; Chen, C. W.; Chi, G. C.
February 2010
Applied Physics Letters;2/8/2010, Vol. 96 Issue 6, p062112
Academic Journal
X-ray absorption near-edge structure (XANES), extended x-ray absorption fine structures (EXAFS), and photoluminescence measurements were used to elucidate the microstructural and photoluminescence properties of ZnO nanowires (ZnO-NWs) that had been treated with Eu by thermal diffusion. The O K- and Eu L3-edge XANES and EXAFS spectra at the Zn K- and Eu L3-edge verified the formation of Eu2O3-like layer on the surface of ZnO-NWs. X-ray diffraction, XANES and EXAFS measurements consistently suggest the lack of substitutional doping of Eu ions at the Zn ion sites in the interior of ZnO-NWs. The clear sharp and intense emission bands in the range 610–630 nm of Eu-treated ZnO-NWs originated from the intra-4f transition of Eu ions in the Eu2O3-like surface layer.


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