TITLE

Structural and electrical properties of ZnO nanorods and Ti buffer layers

AUTHOR(S)
Kwak, C.-H.; Kim, B.-H.; Park, C.-I.; Seo, S.-Y.; Kim, S.-H.; Han, S.-W.
PUB. DATE
February 2010
SOURCE
Applied Physics Letters;2/1/2010, Vol. 96 Issue 5, p051908
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Vertically-well-aligned ZnO nanorods were synthesized on Ti buffer layers by a metal-organic chemical-vapor deposition process. Structural analyses demonstrated that the ZnO nanorods were well-aligned in the c-axis and ab-plane. Transmission electron microscopy (TEM) showed that the Ti buffer layer was amorphous and interdiffused into the ZnO nanorods. Energy-dispersive spectroscopy (EDS) analysis revealed the Ti buffer layers to be slightly oxide. Extended x-ray absorption fine structure confirmed the TEM and EDS results. The I-V characteristic measurements showed a 20-fold increase in current density with the Ti buffer layer, suggesting excellent electrical contact between the Ti buffer layer and ZnO nanorods.
ACCESSION #
47929065

 

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