Direct investigation on conducting nanofilaments in single-crystalline Ni/NiO core/shell nanodisk arrays

Inrok Hwang; Jinsik Choi; Sahwan Hong; Jin-Soo Kim; Ik-Su Byun; Jae Ho Bahng; Ja-Yong Koo; Sung-Oong Kang; Bae Ho Park
February 2010
Applied Physics Letters;2/1/2010, Vol. 96 Issue 5, p053112
Academic Journal
We report resistive switching characteristics of single-crystalline Ni/NiO core/shell nanodisk arrays, in which the conducting filaments are highly localized on the surface of nanostructure. The local current distributions observed in such a single-grained nanodisk demonstrate that the contact area and the contact time between the conductive tip of conducting atomic force microscopy and the surface of nanodisk critically influence the voltage-stress-induced electroforming behaviors of nanofilaments in NiO switching nanoblocks. These contact parameters, such as the contact area and the contact time, are interpreted to the electrode size and the voltage-stress time for the formation of filaments in metal oxides.


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