TITLE

Soft x-ray holographic microscopy

AUTHOR(S)
Stickler, Daniel; Frömter, Robert; Stillrich, Holger; Menk, Christian; Tieg, Carsten; Streit-Nierobisch, Simone; Sprung, Michael; Gutt, Christian; Stadler, Lorenz-M.; Leupold, Olaf; Grübel, Gerhard; Oepen, Hans Peter
PUB. DATE
January 2010
SOURCE
Applied Physics Letters;1/25/2010, Vol. 96 Issue 4, p042501
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We present a new x-ray microscopy technique based on Fourier transform holography (FTH), where the sample is separate from the optics part of the setup. The sample can be shifted with respect to the holography optics, thus large-scale or randomly distributed objects become accessible. As this extends FTH into a true microscopy technique, we call it x-ray holographic microscopy (XHM). FTH allows nanoscale imaging without the need for nanometer-size beams. Simple Fourier transform yields an unambiguous image reconstruction. We demonstrate XHM by studying the magnetic domain evolution of a Co/Pt multilayer film as function of locally varied iron overlayer thickness.
ACCESSION #
47807506

 

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