Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays

Lee, J.-S.; Vescovo, E.; Arena, D. A.; Kao, C.-C.; Beaujour, J.-M.; Kent, A. D.; Jang, H.; Park, J.-H.; Kim, J.-Y.
January 2010
Applied Physics Letters;1/25/2010, Vol. 96 Issue 4, p042507
Academic Journal
An in-plane vectorial analysis of the magnetization of thin magnetic films is presented. Longitudinal soft x-ray resonant magnetic reflectivity curves display characteristic nodes where the longitudinal scattering component is suppressed by x-ray interference. The transverse magnetic component can be effectively retrieved at these nodal points, despite the use of circular polarization and longitudinal scattering geometry. Using a single geometric configuration, transverse and longitudinal magnetic hysteresis loops can be clearly separated. Calculations based on a Stoner–Wohlfarth model satisfactorily describe both loops. Therefore, this method presents a viable alternative to standard vectorial analysis techniques, with the additional benefit of element specificity.


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