TITLE

Ultrahigh vacuum/high-pressure flow reactor for surface x-ray diffraction and grazing incidence small angle x-ray scattering studies close to conditions for industrial catalysis

AUTHOR(S)
van Rijn, R.; Ackermann, M. D.; Balmes, O.; Dufrane, T.; Geluk, A.; Gonzalez, H.; Isern, H.; de Kuyper, E.; Petit, L.; Sole, V. A.; Wermeille, D.; Felici, R.; Frenken, J. W. M.
PUB. DATE
January 2010
SOURCE
Review of Scientific Instruments;Jan2010, Vol. 81 Issue 1, p014101
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A versatile instrument for the in situ study of catalyst surfaces by surface x-ray diffraction and grazing incidence small angle x-ray scattering in a 13 ml flow reactor combined with reaction product analysis by mass spectrometry has been developed. The instrument bridges the so-called “pressure gap” and “materials gap” at the same time, within one experimental setup. It allows for the preparation and study of catalytically active single crystal surfaces and is also equipped with an evaporator for the deposition of thin, pure metal films, necessary for the formation of small metal particles on oxide supports. Reactions can be studied in flow mode and batch mode in a pressure range of 100–1200 mbar and temperatures up to 950 K. The setup provides a unique combination of sample preparation, characterization, and in situ experiments where the structure and reactivity of both single crystals and supported nanoparticles can be simultaneously determined.
ACCESSION #
47807353

 

Related Articles

  • Real-Time Monitoring of Growing Nanoparticles by in situ Small Angle Grazing Incidence X-Ray Scattering. Renaud, Gilles // AIP Conference Proceedings;2005, Vol. 748 Issue 1, p63 

    A challenge to produce nano-objects with given properties is to control in situ and in real time large collection of growing nanoparticles at a macroscopic scale. This requires to go beyond existing post mortem and/or time consuming analyzes. A dedicated Grazing Incidence Small Angle X-ray...

  • Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering. Hendrich, C.; Favre, L.; Ievlev, D. N.; Dobrynin, A. N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. // Applied Physics A: Materials Science & Processing;Mar2007, Vol. 86 Issue 4, p533 

    Ensembles of nanometer-sized Au, Co, Er, and FePt clusters were generated by a laser vaporization source and embedded in a MgO matrix grown on a mica substrate. The size distribution of the clusters was measured before sample preparation by time-of-flight mass spectrometry and afterwards by...

  • Small-Angle X-ray Scattering Study of the Structure of Self-Organized Polymer Matrices and Formation of Imbedded Metal Nanoparticles. Svergun, D. I.; Shtykova, É. V.; Kozin, M. B.; Volkov, V. V.; Konarev, P. V.; Dembo, A. T.; Shtykova, E. V.; Bronshtein, L. M.; Chernyshov, D. M.; Platonova, O. A.; Yakunin, A. N.; Valetsky, P. M.; Khokhlov, A. R. // Crystallography Reports;Jul2001, Vol. 46 Issue 4, p586 

    The structures of self-organizing polymer matrices based on collapsed gels and polyoctadecylsiloxanes have been studied by the methods of conventional and anomalous X-ray small-angle scattering with the use of the laboratory and synchrotron sources of X-ray radiation. The process of formation of...

  • Structural study of nanoporous carbon produced from polycrystalline carbide materials: small-angle x-ray scattering. Kyutt, R. N.; Smorgonskaya, É. A.; Danishevskiı, A. M.; Gordeev, S. K.; Grechinskaya, A. V. // Physics of the Solid State;Aug99, Vol. 41 Issue 8, p1359 

    An x-ray small-angle scattering study is reported of the structure of nanoporous carbon prepared by chlorinating carbide compounds having different crystal structures (SiC, TiC, Mo[sub 2]C). The measurements were carried out both in reflection and transmission. The angular dependences of the...

  • DARTS hits bullseye with X-ray scattering.  // European Chemical News;8/18/2003, Vol. 79 Issue 2065, p25 

    Reports the claims of Daresbury Analytical Research and Technology Service that were able to measure the size distribution of nanoparticles using small angle X-ray scattering with liquid suspensions and dry powders.

  • Characterizing nanoparticles with a laboratory diffractometer: from small-angle to total X-ray scattering. Sommariva, Marco; Gateshki, Milen; Gertenbach, Jan-André; Bolze, Joerg; König, Uwe; Vasile, Bogdan Ştefan; Surdu, Vasile-Adrian // Powder Diffraction;Dec2014 Supplement, Vol. 29 Issue S1, pS47 

    X-ray diffraction and scattering on a single multipurpose X-ray platform have been used to probe the structure, composition, and thermal behavior of TiO2 nanoparticles ranging in size from 1 to 10 nm. Ambient and non-ambient Bragg diffraction, small-angle X-ray scattering (SAXS), as well as...

  • Effect of counterpressure during equal-channel angular pressing on nanoporosity formation in ultrafine-grained copper. Betekhtin, V.; Tabachnikova, E.; Kadomtsev, A.; Narykova, M.; Lapovok, R. // Technical Physics Letters;Aug2011, Vol. 37 Issue 8, p767 

    Results of small-angle X-ray scattering and high-precision density measurements showed that the application of counterpressure during the equal-channel angular pressing (ECAP) of ultrafine-grained copper leads to a decrease in nanoporosity and an increase in mechanical properties of the...

  • Coherent diffraction tomography of nanoislands from grazing-incidence small-angle x-ray scattering. Yefanov, O. M.; Zozulya, A. V.; Vartanyants, I. A.; Stangl, J.; Mocuta, C.; Metzger, T. H.; Bauer, G.; Boeck, T.; Schmidbauer, M. // Applied Physics Letters;3/23/2009, Vol. 94 Issue 12, p123104 

    The combination of grazing-incidence small-angle x-ray scattering with tomographic and phase retrieval methods is presented for the reconstruction of the three-dimensional (3D) electron density of nanometer sized objects. The measured 3D intensity distribution in reciprocal space is used for the...

  • Ultra Low-κ Metrology Using X-Ray Reflectivity And Small-Angle X-Ray Scattering Techniques. Plantier, L.; Gonchond, J.-P.; Pernot, F.; Peled, A.; Wyon, C.; Royer, J.-C.; Yokhin, B. // AIP Conference Proceedings;9/26/2007, Vol. 931 Issue 1, p347 

    The automated metrology tool, combining X-ray reflectivity XRR and small-angle X-ray scattering SAXS has been demonstrated as a capable equipment to assess standard porous Ultra low-κ (ULK) metrology. Therefore those techniques have enabled characterizations of several ULK used in sub-65 nm...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics