Calibrating the atomic balance by carbon nanoclusters

Fengqi Song; Xuefeng Wang; Powles, Rebecca C.; Longbing He; Marks, Nigel A.; Shifeng Zhao; Jianguo Wan; Zongwen Liu; Jianfeng Zhou; Ringer, Simon P.; Min Han; Guanghou Wang
January 2010
Applied Physics Letters;1/18/2010, Vol. 96 Issue 3, p033103
Academic Journal
Carbon atoms are counted at near atomic-level precision using a scanning transmission electron microscope calibrated by carbon nanocluster mass standards. A linear calibration curve governs the working zone from a few carbon atoms up to 34 000 atoms. This linearity enables adequate averaging of the scattering cross sections, imparting the experiment with near atomic-level precision despite the use of a coarse mass reference. An example of this approach is provided for layer counting of stacked graphene sheets. Suspended graphene sheets with a size below 100 nm are visualized, providing quantitative measurement in a regime inaccessible to optical and scanning probe methods.


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