TITLE

Application of surface chemical analysis tools for characterization of nanoparticles

AUTHOR(S)
Baer, D. R.; Gaspar, D. J.; Nachimuthu, P.; Techane, S. D.; Castner, D. G.
PUB. DATE
February 2010
SOURCE
Analytical & Bioanalytical Chemistry;Feb2010, Vol. 396 Issue 3, p983
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The important role that surface chemical analysis methods can and should play in the characterization of nanoparticles is described. The types of information that can be obtained from analysis of nanoparticles using Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (TOF-SIMS), low-energy ion scattering (LEIS), and scanning-probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), are briefly summarized. Examples describing the characterization of engineered nanoparticles are provided. Specific analysis considerations and issues associated with using surface-analysis methods for the characterization of nanoparticles are discussed and summarized, with the impact that shape instability, environmentally induced changes, deliberate and accidental coating, etc., have on nanoparticle properties. [Figure not available: see fulltext.]
ACCESSION #
47656732

 

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