Twinning rotation and ferroelectric behavior of epitaxial BiFeO3 (001) thin film

Huajun Liu; Ping Yang; Kui Yao; Wang, John
January 2010
Applied Physics Letters;1/4/2010, Vol. 96 Issue 1, p012901
Academic Journal
A twinning rotation structure is revealed by reciprocal space mappings obtained from synchrotron X-ray diffraction for the epitaxial BiFeO3 thin film that was grown on (001) SrTiO3 substrate. The lattice strain is not fully relaxed at a film thickness of 720 nm. The structure is indexed as a monoclinic with lattice parameters a=5.610(1) Å, b=5.529(1) Å, c=4.031(1) Å, and β=89.34(1)°. The twinning rotation leads to an enhanced remanent polarization (2Pr=164 μC/cm2, 2Ec=510 kV/cm) and greatly reduced leakage current density of 1.2×10-6 A/cm2 at 100 kV/cm.


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