TITLE

Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains

AUTHOR(S)
Mikkelsen, A.; Schwenke, J.; Fordell, T.; Luo, G.; Klünder, K.; Hilner, E.; Anttu, N.; Zakharov, A. A.; Lundgren, E.; Mauritsson, J.; Andersen, J. N.; Xu, H. Q.; L'Huillier, A.
PUB. DATE
December 2009
SOURCE
Review of Scientific Instruments;Dec2009, Vol. 80 Issue 12, p123703
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We report the first experiments carried out on a new imaging setup, which combines the high spatial resolution of a photoemission electron microscope (PEEM) with the temporal resolution of extreme ultraviolet (XUV) attosecond pulse trains. The very short pulses were provided by high-harmonic generation and used to illuminate lithographic structures and Au nanoparticles, which, in turn, were imaged with a PEEM resolving features below 300 nm. We argue that the spatial resolution is limited by the lack of electron energy filtering in this particular demonstration experiment. Problems with extensive space charge effects, which can occur due to the low probe pulse repetition rate and extremely short duration, are solved by reducing peak intensity while maintaining a sufficient average intensity to allow imaging. Finally, a powerful femtosecond infrared (IR) beam was combined with the XUV beam in a pump-probe setup where delays could be varied from subfemtoseconds to picoseconds. The IR pump beam could induce multiphoton electron emission in resonant features on the surface. The interaction between the electrons emitted by the pump and probe pulses could be observed.
ACCESSION #
47244380

 

Related Articles

  • Measuring the top–bottom effect of a tilted thick specimen in an ultrahigh-voltage electron microscope. Hai-Bo Zhang; Chao Yang; Akio Takaoka // Review of Scientific Instruments;May2005, Vol. 76 Issue 5, p056106 

    From the 40 nm gold particles on the surface of a 5 μm thick amorphous specimen tilted by a 360° tilt holder, we have observed the top–bottom effect (TBE) in a 3 MV ultrahigh-voltage electron microscope. Because of the TBE, object points located on the top surface of the specimen...

  • Inverse photoemission. Johnson, P. D.; Hulbert, S. L. // Review of Scientific Instruments;Sep90, Vol. 61 Issue 9, p2277 

    We review the experimental apparatus presently available for use in inverse photoemission spectroscopy (IPES) in the vacuum ultraviolet (5–30 eV) energy range. We consider the design and use of different photon detectors including the gas-filled Geiger Muller counters and the more recent...

  • Invited Review Article: Methods for imaging weak-phase objects in electron microscopy. Glaeser, Robert M. // Review of Scientific Instruments;Nov2013, Vol. 84 Issue 11, p111101 

    Contrast has traditionally been produced in electron-microscopy of weak phase objects by simply defocusing the objective lens. There now is renewed interest, however, in using devices that apply a uniform quarter-wave phase shift to the scattered electrons relative to the unscattered beam, or...

  • SIMULATION OF THE EXPERIMENTAL HRTEM CONTRAST OF ICOSAHEDRAL GOLD NANOPARTICLES OF DIFFERENT SIZES. Reyes-Gasga, J.; Tehuacanero-Nuñez, S.; Montejano-Carrizales, J. M. // Acta Microscopica;2009, Vol. 18 Issue 3, p304 

    Experimental contrasts of high-resolution transmission electron microscope (HRTEM) of icosahedral gold nanoparticles with 2.8, 4, 9 and 15 nm in diameter are simulated in this work, mainly those close to the five-fold axis. Experimentally it has been shown that the contrast shown by these...

  • Upgrade of absolute extreme ultraviolet diagnostic on J-TEXT. Zhang, X. L.; Cheng, Z. F.; Hou, S. Y.; Zhuang, G.; Luo, J. // Review of Scientific Instruments;2014, Vol. 85 Issue 11, p1 

    The absolute extreme ultraviolet (AXUV) diagnostic system is used for radiation observation on J-TEXT tokamak [J. Zhang, G. Zhuang, Z. J. Wang, Y. H. Ding, X. Q. Zhang, and Y. J. Tang, Rev. Sci. Instrum. 81, 073509 (2010)]. The upgrade of the AXUV system is aimed to improve the spatial...

  • Pulsed mirror electron microscope: A fast near-surface imaging probe. Kleinschmidt, H.; Bostanjoglo, O. // Review of Scientific Instruments;Oct2001, Vol. 72 Issue 10, p3898 

    A pulsed mirror electron microscope was developed for imaging laser-induced processes on the nanosecond time scale. Variations of the electronic structure of the surface are imaged. The evaporation or deposition of an atomic monolayer is readily detected. Pulsed mirror electron microscopy is an...

  • NEW INSTRUMENTS. Stern, Joshua // Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2421 

    Presents scientific instruments for various purposes and applications. Electron microscopes; Impact testers; Vibration-isolation workstations; Nitrogen generation systems.

  • Parallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscope. Batson, P. E. // Review of Scientific Instruments;Jul1988, Vol. 59 Issue 7, p1132 

    A parallel detection system has been added to the Wien Filter electron spectrometer on the dedicated scanning transmission electron microscope at IBM. The system uses an intensified diode array that is optically coupled to a single-crystal YAG screen by a vacuum window and an f/1.4–22...

  • A reflection electron microscope for imaging of fast phase transitions on surfaces. Bostanjoglo, O.; Heinricht, F. // Review of Scientific Instruments;Apr90, Vol. 61 Issue 4, p1223 

    A reflection electron microscope for ultrashort-time imaging of laser-induced processes on surfaces was developed. The instrument is based on a conventional transmission electron microscope modified for high-energy electron reflection, and, in addition, equipped with a laser-pulsed...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics