TITLE

Shear force scanning near-field optical microscope based on a piezoelectric bimorph cantilever

AUTHOR(S)
Shang, G. Y.; Wang, C.; Wu, J.; Bai, C. L.; Lei, F. H.
PUB. DATE
May 2001
SOURCE
Review of Scientific Instruments;May2001, Vol. 72 Issue 5, p2344
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
In this article we present a simple, nonoptical shear force detection scheme to control probe-sample distance for a scanning near-field optical microscope (SNOM). Shear force detection is realized by attaching a tapered optical fiber probe to a piezoelectric bimorph cantilever in which one piezo layer generates a maximum piezo voltage when the cantilever is excited at resonance by the other piezo layer. The amplitude of the piezo voltage will decrease as the probe approaches a sample's surface due to probe-sample interacting shear force. Keeping the piezo voltage constant provides a very sensitive method by which to control probe-sample distance. Based on the shear force detection scheme, a shear force SNOM system has been built, operating in transmission collection mode. Shear force topographic and optical images have been taken using uncoated optical fiber probes fabricated by a chemical etching technique. The results suggest that the system is very reliable, repeatable, and easy to use. © 2001 American Institute of Physics.
ACCESSION #
4717169

 

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics