Near-field photoreflectance spectroscopy of quantum well structures

Cho, Yong-Hoon; Kim, Dai-Sik; Jhe, Wonho
April 2001
Applied Physics Letters;4/16/2001, Vol. 78 Issue 16, p2306
Academic Journal
We present near-field photoreflectance (NPR) spectroscopic studies of GaAs/Al[sub 0.3]Ga[sub 0.7]As quantum well structures using a near-field scanning optical microscope with either an uncoated or a metal-coated tapered optical fiber probe. The NPR method provides advantages over conventional optical microscopic ones: (i) higher signal-to-noise ratio, (ii) lower temperature-sensitivity of the signal, and (iii) more information about higher electronic energy states. We also discuss the feasibility of a imaging with high resolution and contrast by using the NPR method. © 2001 American Institute of Physics.


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