Scanning Hall probe microscopy of flux penetration into a superconducting YBa[sub 2]Cu[sub 3]O[sub 7-δ] thin film strip

Grigorenko, A. N.; Bending, S. J.; Gregory, J. K.; Humphreys, R. G.
March 2001
Applied Physics Letters;3/12/2001, Vol. 78 Issue 11, p1586
Academic Journal
A high-resolution scanning Hall probe microscope has been used to measure flux profiles across one "wire" of a long YBa[sub 2]Cu[sub 3]O[sub 7-δ] thin-film meander line as a function of both transport current density and applied magnetic field. Flux bundle penetration due to an applied current or magnetic field is demonstrated to occur at the same regions at the edge of the strip. A correlation between the surface topography of the meander line edges and the regions of penetration has been established. Penetrating flux profiles at low temperatures are in qualitative agreement with theories of dynamical instability of the order parameter. © 2001 American Institute of Physics.


Related Articles

  • Real-time scanning Hall probe microscopy. Oral, A.; Bending, S. J.; Henini, M. // Applied Physics Letters;8/26/1996, Vol. 69 Issue 9, p1324 

    We describe a low-noise scanning Hall probe microscope having unprecedented magnetic field sensitivity (∼2.9×10-8 T/&sqrt;Hz at 77 K), high spatial resolution, (∼0.85 μm), and operating in real-time (∼1 frame/s) for studying flux profiles at surfaces. A submicron Hall probe...

  • Recent advances in spin-polarized scanning tunneling microscopy. O.3 Pietzsch, S. S.; Kubetzka, A.; Bode, M.; Wiesendanger, R. // Applied Physics A: Materials Science & Processing;2004, Vol. 78 Issue 6, p781 

    Considerable progress in the field of spin-polarized scanning tunneling microscopy (SP-STM) has been achieved recently by gaining a high degree of control with regard to properties of the tunneling tip. It is found that by choosing the appropriate material for the magnetic thin film coating of...

  • Structural and Magnetic Investigation of Cu, Co Substituted NiFe2O4 Thin Films by Scanning Probe Microscopy (AFM, MFM). Sharma, Hakikat; Negi, N. S. // Materials Science Forum;2015, Vol. 830-831, p589 

    In the present study we prepared NiFe2O4, Ni0.95Cu0.05Fe2O4 and Ni0.94Cu0.05Co0.01 Fe2O4 thin films by metallo- organic decomposition method (MOD) using spin coating technique. The samples were characterized by XRD. XRD patterns of thin films confirmed the formation of cubic spinel structure...

  • Modular low temperature laser scanning microscope for high magnetic fields. Peschka, M.; Mu¨hlschlegel, P.; Kleiner, R. // AIP Conference Proceedings;2002, Vol. 613 Issue 1, p1726 

    A Low Temperature Laser Scanning Microscope (LTLSM) for use in magnetic fields up to 5 T in a temperature range from 10 K to 300 K is described. An important feature of the LTLSM is an optical performance (2 µm laser spot diameter, 250 µm x 250 µm scanning field size) which is...

  • Combined millimeter-wave near-field microscope and capacitance distance control for the quantitative mapping of sheet resistance of conducting layers. Lann, A. F.; Golosovsky, M.; Davidov, D.; Frenkel, A. // Applied Physics Letters;11/9/1998, Vol. 73 Issue 19 

    We present a dual-frequency electromagnetic scanning probe and apply it for quantitative mapping of the sheet resistance of conducting films. The high-frequency (82 GHz) mode is used for image acquisition, while the low-frequency (5 MHz) mode is used for distance control. We measure magnitude...

  • Temperature rise during silicon-on-glass recrystallization produced by ac magnetic fields. Hayama, Hiroshi; Saito, Takeshi // Journal of Applied Physics;10/1/1992, Vol. 72 Issue 7, p2817 

    Presents a study which examined the temperature rise in thin films during heating produced by alternating current magnetic fields. Details on the general line-symmetric magnetic flux density distribution; Description of the cross-sectional view of silicon on glass wafer; Types of...

  • Near-field magneto-optics and high density data storage. Betzig, E.; Trautman, J.K. // Applied Physics Letters;7/13/1992, Vol. 61 Issue 2, p142 

    Investigates the utilization of near-field scanning optical microscopy in imaging and recording domains in thin-film magneto-optic materials. Range of resolution obtained in the imaging mode; Demonstration of the highest bit density achieved; Application of the technique for high density data...

  • Micromagnetic scanning microprobe system. Thompson, C. A.; Cross, R. W.; Kos, A. B. // Review of Scientific Instruments;Feb1994, Vol. 65 Issue 2, p383 

    We describe the apparatus, instrumentation, and data acquisition techniques which make up the micromagnetic scanning microprobe system (MSMS). This system was developed to study magnetoresistive (MR) thin films used in magnetic recording read heads. It uses a dc, four-probe resistance...

  • Scanning probe nanostructuring of YBa[sub 2]Cu[sub 3]O[sub 7]: A corrosion induced abrasion. Boneberg, J.; Bohmisch, M. // Applied Physics Letters;12/29/1997, Vol. 71 Issue 26, p3805 

    Demonstrates the process of scanning probe nanostructuring of YBa[sub 2]Cu[sub 3]O[sub 7] thin films using an atomic force microscope. Comparison between corroded and clean surface resistance to mechanical forces; Promotion of corrosion by electric current; Abrasion of corroded surface in the...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics