Ordinary and extraordinary dielectric functions of 4H- and 6H-SiC from 3.5 to 9.0 eV

Lindquist, O. P. A.; Ja¨rrendahl, K.; Peters, S.; Zettler, J. T.; Cobet, C.; Esser, N.; Aspnes, D. E.; Henry, A.; Edwards, N. V.
April 2001
Applied Physics Letters;4/30/2001, Vol. 78 Issue 18, p2715
Academic Journal
We report ordinary (ε⊥c axis) and extraordinary (ε||c axis) dielectric function data of 4H- and 6H-SiC from 3.5 to 9.0 eV. These data, which were obtained by with spectroscopic ellipsometry, are also compared to recently reported ab initio calculations. Critical point energies were found using real and reciprocal space analysis. © 2001 American Institute of Physics.


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