TITLE

Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy

AUTHOR(S)
Gruverman, A.; Kholkin, A.; Kingon, A.; Tokumoto, H.
PUB. DATE
April 2001
SOURCE
Applied Physics Letters;4/30/2001, Vol. 78 Issue 18, p2751
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Scanning force microscopy (SFM) has been used to perform nanoscale studies of the switching behavior of Pb(Zr, Ti)O[sub 3] thin films via the direct observation of their domain structures. The study revealed a significant asymmetry of a switching pattern which is a function of the voltage polarity and original domain structure of individual grains. The phenomenon of asymmetric switching is attributed (1) to the presence of an internal built-in electric field at the bottom interface and (2) to the mechanical stress exerted by the SFM tip. The former effect results in incomplete 180° switching, while the latter effect leads to a 90° rotation of the polarization vector. The resulting shear stress deformation of the grain underneath the tip combined with the applied field effect propels polarization reversal in the adjacent grains. © 2001 American Institute of Physics.
ACCESSION #
4711327

 

Related Articles

  • Local poling of ferroelectric polymers by scanning force microscopy. Guthner, P.; Dransfeld, K. // Applied Physics Letters;8/31/1992, Vol. 61 Issue 9, p1137 

    Demonstrates the local poling of ferroelectric polymer films by scanning force microscopy (SFM). Application of a direct current voltage between the tip of SFM and the electrode underneath the polymer film; Factors attributed to the detection of the polarized regions; Size of the smallest...

  • Imaging and engineering the nanoscale-domain structure of a Sr[sub 0.61]Ba[sub 0.39]Nb[sub 2]O[sub 6] crystal using a scanning force microscope. Terabe, K.; Takekawa, S.; Nakamura, M.; Kitamura, K.; Higuchi, S.; Gotoh, Y.; Gruverman, A. // Applied Physics Letters;9/9/2002, Vol. 81 Issue 11, p2044 

    We have investigated the ferroelectric domain structure formed in a Sr[sub 0.61]1Ba[sub 0.39]Nb[sub 2]O[sub 6] single crystal by cooling the crystal through the Curie point. Imaging the etched surface structure using a scanning force microscope (SFM) in both the topographic mode and the...

  • Scanning force microscopy investigation of the Pb(Zr[sub 0.25]Ti[sub 0.75])O[sub 3]/Pt interface. Lu, X. M.; Schlaphof, F.; Grafström, S.; Loppacher, C.; Eng, L. M.; Suchaneck, G.; Gerlach, G. // Applied Physics Letters;10/21/2002, Vol. 81 Issue 17, p3215 

    We report on a novel approach for the investigation of the Pb(Zr[sub x]Ti[sub 1-x])O[sub 3]/Pt interface applying scanning force microscopy techniques. Ferroelectric samples (PZT film/Pt/SiO[sub 2]/Si) were polished at a shallow angle (∼6.1°) thereby enlarging the film cross section from...

  • Mapping the domain distribution at ferroelectric surfaces by scanning force microscopy. Abplanalp, M.; Eng, L.M.; Günter, P. // Applied Physics A: Materials Science & Processing;1998, Vol. 66 Issue 7, pS231 

    Abstract. We report contact scanning force measurement of the domain distribution at ferroelectric surfaces. The orientation of the polarization vectors for different ferroelectric domains becomes visible when applying an a.c. voltage between tip and sample. The resulting perpendicular...

  • Nanometer-scale modification of the tribological properties of Si(100) by scanning force microscope. Teuschier, T.; Mahr, K. // Applied Physics Letters;5/8/1995, Vol. 66 Issue 19, p2499 

    Examines hydrogen-terminated Si(100) surface-modification on the nanometer scale using a conducting-probe scanning force microscope (SFM). Description of voltage distribution patterns; Procedures for SFM-lithography performance; Measurements of friction force and height of oxide protrusion...

  • Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films. Gruverman, A.; Rodriguez, B. J.; Nemanich, R. J.; Kingon, A. I. // Journal of Applied Physics;9/1/2002, Vol. 92 Issue 5, p2734 

    Piezoresponse force microscopy has been used to investigate the nanoscale mechanism of imprint behavior of ferroelectric PbTiO[sub 3] thin films by studying the photoinduced changes in the hysteresis loops of individual grains. Illumination of the film with UV light resulted in a voltage shift...

  • Domain patterning thin crystalline ferroelectric film with focused ion beam for nonlinear photonic integrated circuits. Li, Xijun; Terabe, Kazuya; Hatano, Hideki; Zeng, Huarong; Kitamura, Kenji // Journal of Applied Physics;11/15/2006, Vol. 100 Issue 10, p106103 

    Domain patterning thin ferroelectric films creates nonlinear optical devices. Unfortunately, pinholes cause conventional electrical domain-poling methods to short circuit when used on thin film. We have applied a focused ion beam (FIB) to pattern the ferroelectric domains of LiNbO3 single...

  • DNA On Surfaces: Adsorption, Equilibration And Recognition Processes From A Microscopist’s View. Zuccheri, Giampaolo; Bergia, Anna; Scipioni, Anita; De Santis, Pasquale; Samorì, Bruno // AIP Conference Proceedings;2002, Vol. 640 Issue 1, p23 

    The availability of a number of methods to controllably adsorb DNA on solid surfaces is useful to researchers working in different fields, such as structural biology, biophysical chemistry, diagnostics, sensorics, and nanotechnology. In this paper, we review some of the methods that have been...

  • Nonlinear local piezoelectric deformation in ferroelectric thin films studied by scanning force microscopy. Shvartsman, V. V.; Pertsev, N. A.; Herrero, J. M.; Zaldo, C.; Kholkin, A. L. // Journal of Applied Physics;5/15/2005, Vol. 97 Issue 10, p104105-1 

    Local piezoelectric deformation is investigated in (Pb,La)TiO3 (PLT) and Pb(Zr,Ti)O3 (PZT) thin films via scanning force microscopy (SFM) as a function of the ac voltage Vac applied between the conducting tip and the bottom electrode. Thus obtained voltage dependence of the effective...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics