Dielectric loss and defect mode of SrTiO[sub 3] thin films under direct-current bias

Ang, Chen; Cross, L. E.; Yu, Zhi; Guo, Ruyan; Bhalla, A. S.; Hao, Jian Hua
April 2001
Applied Physics Letters;4/30/2001, Vol. 78 Issue 18, p2754
Academic Journal
The dielectric behavior of SrTiO[sub 3] thin films prepared by the pulsed-laser deposition technique on SrTiO[sub 3] single-crystal substrates is studied under dc electric field. A high dielectric constant maximum ε[sub max](∼2280) and a low-loss tan δ (∼0.001) are obtained. Compared with the observation in SrTiO[sub 3] single crystals, an additional dielectric loss peak with frequency dispersion is observed around 150 K (at 1 kHz). With increasing dc bias, the peak is suppressed and finally disappears at ∼350 kV/cm; however, the temperature at which the peak occurs is independent of electric field. The possible physical mechanism of the peak is briefly discussed. © 2001 American Institute of Physics.


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