X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O[sub 3] films

Thompson, Carol; Munkholm, A.; Streiffer, S. K.; Stephenson, G. B.; Ghosh, K.; Eastman, J. A.; Auciello, O.; Bai, G.-R.; Lee, M. K.; Eom, C. B.
May 2001
Applied Physics Letters;5/28/2001, Vol. 78 Issue 22, p3511
Academic Journal
We have probed the microscopic distribution of 180° domains as a function of switching history in 40 nm epitaxial films of Pb(Zr[sub 0.30]Ti[sub 0.70])O[sub 3] by analyzing interference effects in the x-ray scattering profiles. These as-grown films exhibit voltage offsets (imprint) in the polarization hysteresis loops, coupled with a strongly preferred polarization direction in the virgin state. Our x-ray results are consistent with models attributing the loss of switchable polarization to the inhibition of the formation of oppositely polarized domains in a unipolar matrix. Using such model epitaxial films, we demonstrate that different microscopic ensembles of domains resulting from, for example, fatigue, may be resolved by this technique. © 2001 American Institute of Physics.


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