TITLE

Minimization of noise-induced bit error rate in a high T[sub c] superconducting dc/single flux quantum converter

AUTHOR(S)
Ortlepp, Thomas; Toepfer, Hannes; Uhlmann, Hermann F.
PUB. DATE
February 2001
SOURCE
Applied Physics Letters;2/26/2001, Vol. 78 Issue 9, p1279
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The thermally induced bit error rate of a rapid single flux quantum logic circuit is theoretically examined using the Fokker-Planck equation. The error rate versus design parameters of a high T[sub c] dc/single flux quantum converter is derived. In comparison with other design methodologies, a vanishingly small error rate at optimal parameters can be achieved. © 2001 American Institute of Physics.
ACCESSION #
4711111

 

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