TITLE

Low-temperature scanning probe microscopy of surface and subsurface charges

AUTHOR(S)
Vogel, Markus; Stein, Bernhard; Pettersson, Håkan; Karrai, Khaled
PUB. DATE
April 2001
SOURCE
Applied Physics Letters;4/23/2001, Vol. 78 Issue 17, p2592
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Studies the operation of cryogenic scanning force microscope using a sensitivity of 50 fN per square root hertz at 5 kilohertz modulation. Uses of force microscope; Low-temperature scanning probe microscopy of surface and subsurface charges; Capacitance imaging of nanostructured surfaces.
ACCESSION #
4710987

 

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