TITLE

X-ray scattering from misfit dislocations in heteroepitaxial films: The case of Nb(110) on Al[sub 2]O[sub 3]

AUTHOR(S)
Barabash, R. I.; Donner, W.; Dosch, H.
PUB. DATE
January 2001
SOURCE
Applied Physics Letters;1/22/2001, Vol. 78 Issue 4, p443
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We apply the Krivoglaz theory of x-ray scattering to thin epitaxial films containing misfit dislocations and reanalyze the seemingly puzzling x-ray scattering phenomena observed in several heteroepitaxial films. We show that the two-line shape scattering distribution and its dependence upon film thickness and momentum transfer can be understood in natural way and on a quantitative level. Extended diffuse x-ray scattering maps have been obtained from Nb(110)/Al[sub 2]O[sub 3](112¯0) which are discussed within the framework of this theory disclose a particular dislocation network at the Nb-Al[sub 2]O[sub 3] interface.
ACCESSION #
4710966

 

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