Interference pattern of a coherent electron beam by localized leakage magnetic field

Park, Jeong Young; Kim, S. H.; Park, W. G.; Kuk, Y.
March 2001
Applied Physics Letters;3/19/2001, Vol. 78 Issue 12, p1745
Academic Journal
We report on the origin of interference patterns at the edge of nanometer-scale Co protrusions observed by low-energy electron point source (LEEPS) microscopy. We find evidence that those interference patterns are due to the phase shift of a coherent electron beam by a localized magnetic field. Typical interference patterns have an apparent size of 10-100 nm and a star-like shape, which are dependent on the sharpness of the Co protrusion. After preparing a ferromagnetic nanoparticle in a saturation remanent state by applying a strong magnetic field, we observed the deflection of the interference pattern. This phenomenon is consistent with the theoretical prediction based on a magnetostatic model. The capability of mapping the local magnetic field suggests that LEEPS microscopy is potentially applicable as an imaging tool of magnetic field with nanometer-scale resolution. © 2001 American Institute of Physics.


Related Articles

  • Sniffer probe locates sources of EMI. Carsten, Bruce // EDN;06/04/98, Vol. 43 Issue 12, p155 

    Focuses on the difficulty in locating electromagnetic interference (EMI), while highlighting the use of an EMI sniffer probe. Details on the use of these probes; Principle advantages of the miniature multiturn probe; Features of the sniffer probe which allows for the location of EMI;...

  • Frequency modulation of system clocks for EMI reduction. Hoekstra, Cornelis D. // Hewlett-Packard Journal;Aug97, Vol. 48 Issue 4, p101 

    Focuses on clock dithering as an on-chip technique for electromagnetic interference (EMI) reduction. Typical clock dithering circuit; Hewlett-Packard (HP) experiences with dithering; Non-HP clock dithering products; EMI reduction versus modulation waveform; EMI measurement standards;...

  • Use simulation to spot and fix EMI problems. Lam, Cheung-Wei; Powell, Jon // Electronic Design;7/22/96, Vol. 44 Issue 15, p95 

    Focuses on using simulation to spot nd fix electromagnetic-interference problems. Design guidelines; Control techniques; Edge rates and termination; Signal ringing; Filter use; Trace segments.

  • Clearing up radio static.  // Popular Mechanics;Apr97, Vol. 174 Issue 4, p124 

    Discusses the problem of high-frequency electromagnetic interference (EMI) of the radio. Causes of the problem; Steps to be taken in eliminating the noise of the radio; Proper procedures of installing a fresh set of sparkplug wires; Analysis on the capacitors and diodes of the radio. INSETS:...

  • EMI.  // Power Electronics Technology;Dec2011, Vol. 37 Issue 12, p32 

    A directory for companies which manufacture electromagnetic interference (EMI) in the U.S. is presented.

  • Please extinguish your laptop... Kaiser, Jocelyn // New Scientist;12/2/95, Vol. 148 Issue 2006, p34 

    Focuses on the problem of electromagnetic interference (EMI) from microprocessors. Radiation emitted by circuits; Regulations in Europe for manufacturers of electronic devices; Attempts of manufacturers to cut down emissions; Danger posed by EMI to medical equipment.

  • EMC GUIDANCE. Josifovska, Svetlana // Electronics World;Aug2008, Vol. 114 Issue 1868, p5 

    The article discusses various reports published within the issue, including one the aspects of designing with electromagnetic interference (EMI) and electromagnetic compatibility (EMC) and another on the tips, ideas and methodologies as to how to best tackle the blights of EMI and EMC.

  • Method and apparatus to measure electromagnetic interference shielding efficiency and its shielding characteristics in broadband frequency ranges. Hong, Y. K.; Lee, C. Y.; Jeong, C. K.; Lee, D. E.; Kim, K.; Joo, J. // Review of Scientific Instruments;Feb2003, Vol. 74 Issue 2, p1098 

    We have designed and manufactured a flanged coaxial line as a sample holder for measuring the electromagnetic interference (EMI) shielding efficiency (SE) of planar materials in broadband frequency ranges up to 18 GHz. Connecting the samples holder to a vector network analyzer (50...

  • What are the most popular trends you see in EMC, and how do these trends pave the way for the reduction in electromagnetic interference?  // Wireless Design & Development;Jul/Aug2013, Vol. 21 Issue 4, p30 

    The article present answers to a question related to most popular trends in EMC, and means by which these trends pave the way for the reduction in electromagnetic interference.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics