TITLE

Interference pattern of a coherent electron beam by localized leakage magnetic field

AUTHOR(S)
Park, Jeong Young; Kim, S. H.; Park, W. G.; Kuk, Y.
PUB. DATE
March 2001
SOURCE
Applied Physics Letters;3/19/2001, Vol. 78 Issue 12, p1745
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We report on the origin of interference patterns at the edge of nanometer-scale Co protrusions observed by low-energy electron point source (LEEPS) microscopy. We find evidence that those interference patterns are due to the phase shift of a coherent electron beam by a localized magnetic field. Typical interference patterns have an apparent size of 10-100 nm and a star-like shape, which are dependent on the sharpness of the Co protrusion. After preparing a ferromagnetic nanoparticle in a saturation remanent state by applying a strong magnetic field, we observed the deflection of the interference pattern. This phenomenon is consistent with the theoretical prediction based on a magnetostatic model. The capability of mapping the local magnetic field suggests that LEEPS microscopy is potentially applicable as an imaging tool of magnetic field with nanometer-scale resolution. © 2001 American Institute of Physics.
ACCESSION #
4710889

 

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