Linear growth of thin films under the influence of stress

Palasantzas, G.; De Hosson, J. Th. M.
May 2001
Applied Physics Letters;5/14/2001, Vol. 78 Issue 20, p3044
Academic Journal
We have studied the growth of thin films in the presence of stress instability that enhances the roughness and roughening induced by conservative as well as nonconservative noise. It is clearly illustrated that nonconservative noise effects may enhance stress induced roughness. Nevertheless, the incorporation of conservative noise appears to also be substantial in growth processes driven by diffusion. For growth on a rough substrate the dependence of the amplitude of the surface roughness on the film thickness differs from that of a film growing on a flat substrate. The amplitude shows a minimum at a particular substrate thickness, which indicates that the growth up to this thickness is enforced by undulations of the substrate. © 2001 American Institute of Physics.


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