TITLE

Dielectric exchange-force effect on the rupture force of adsorbed bilayers of self-assembled surfactant films

AUTHOR(S)
Teschke, O.; Ceotto, G.; de Souza, E. F.
PUB. DATE
May 2001
SOURCE
Applied Physics Letters;5/14/2001, Vol. 78 Issue 20, p3064
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We measured and formulated dielectric exchange forces between adsorbed layers of self-assembled surfactant films and atomic-force microscope tips in water. The dielectric exchange-force model is in agreement with the observation that the surfactant-layer rupture forces (tip-applied force necessary to obtain tip/substrate contact) are smaller in the thickest layers, where the compactness of the adsorbed film results in the smallest values of the dielectric permittivity. Within experimental accuracy, a dielectric permittivity value of ∼4 for bilayers and of ∼36 for monolayers is found. © 2001 American Institute of Physics.
ACCESSION #
4710697

 

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