Magnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction

Alvarez, Tony; Kalinin, Sergei V.; Bonnell, Dawn A.
February 2001
Applied Physics Letters;2/12/2001, Vol. 78 Issue 7, p1005
Academic Journal
A scanning probe technique for current-carrying device imaging is proposed that combines magnetic-force microscopy with surface-potential nulling measurements. The device is ac biased at an off-resonant frequency and the current-induced magnetic field results in cantilever deflection which is detected by a lock-in amplifier. An ac bias at the resonant frequency is simultaneously applied to the tip and conventional scanning surface-potential microscopy feedback is used to match the tip and surface potentials. This multiple-modulation technique allows electrostatic and magnetic interactions to be distinguished and surface-potential and magnetic-force images to be collected simultaneously. The technique, which is referred to as potential-correction magnetic-force microscopy, produces force rather than force-gradient images as in conventional magnetic-force microscopy. Further prospects for potential-sensitive magnetic-force imaging are discussed. © 2001 American Institute of Physics.


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