Writing and reading perpendicular magnetic recording media patterned by a focused ion beam

Lohau, J.; Moser, A.; Rettner, C. T.; Best, M. E.; Terris, B. D.
February 2001
Applied Physics Letters;2/12/2001, Vol. 78 Issue 7, p990
Academic Journal
We have written and read bit patterns on arrays of square islands cut with a focused ion beam into granular perpendicular magnetic recording media. Using a static write-read tester, we have written square-wave bit patterns on arrays of islands with sizes between 60 and 230 nm, matching the recording linear density to the pattern period. These measurements reveal the onset of single-domain behavior for islands smaller than 130 nm, in agreement with magnetic force microscope images. The recording performance of patterned regions is systematically compared to that of unpatterned regions. © 2001 American Institute of Physics.


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