Structural and magnetic properties of η-phase manganese nitride films grown by molecular-beam epitaxy

Yang, Haiqiang; Al-Brithen, Hamad; Smith, Arthur R.; Borchers, J. A.; Cappelletti, R. L.; Vaudin, M. D.
June 2001
Applied Physics Letters;6/11/2001, Vol. 78 Issue 24, p3860
Academic Journal
Face-centered tetragonal (fct) η-phase manganese nitride films have been grown on magnesium oxide (001) substrates by molecular-beam epitaxy. For growth conditions described here, reflection high energy electron diffraction and neutron scattering show primarily two types of domains rotated by 90° to each other with their c axes in the surface plane. Scanning tunneling microscopy images reveal surface domains consisting of row structures which correspond directly to the bulk domains. Neutron diffraction data confirm that the Mn moments are aligned in a layered antiferromagnetic structure. The data are consistent with the fct model of G. Kreiner and H. Jacobs for bulk Mn[sub 3]N[sub 2] [J. Alloys Compd. 183, 345 (1992)]. © 2001 American Institute of Physics.


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