TITLE

Band-gap engineering in sputter-deposited Sc[sub x]Ga[sub 1-x]N

AUTHOR(S)
Little, M. E.; Kordesch, M. E.
PUB. DATE
May 2001
SOURCE
Applied Physics Letters;5/7/2001, Vol. 78 Issue 19, p2891
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Reactive sputtering was used to grow thin films of Sc[sub x]Ga[sub 1-x]N with scandium concentration of 20%-70% on quartz substrates at temperatures of 300-675 K. X-ray diffraction (XRD) of the films showed either weak or no structure, suggesting the films are amorphous or microcrystalline. Optical absorption spectra were taken of each sample and the optical band gap was determined. The band gap varied linearly with composition between 2.0 and 3.5 eV. ScN and GaN have different crystal structures (rocksalt and wurzite, respectively), and thus may form a heterogeneous mixture as opposed to an alloy. Since the XRD data were inconclusive, bilayers of ScN/GaN were grown and optical absorption spectra taken. A fundamental difference in the spectra between the bilayer films and alloy films was seen, suggesting the films are alloys not heterogeneous mixtures. © 2001 American Institute of Physics.
ACCESSION #
4710425

 

Related Articles

  • Synthesis and characterization of rf-planar magnetron sputtered KTa[sub x]Nb[sub 1-x]O[sub 3].... Sashital, S.R.; Krishnakumar, S.; Esener, S. // Applied Physics Letters;6/7/1993, Vol. 62 Issue 23, p2917 

    Examines the synthesis and characteristics of thin ferroelectric films of potassium tantalate niobate grown by radio frequency planar magnetron sputtering on several substrates. Use of x-ray diffraction analysis; Details on the epitaxial growth of films with (100) orientation; Dielectric...

  • Low-temperature in situ preparation of ferroelectric Pb(Zr[sub 0.55]Ti[sub 0.45])O[sub 3] thin.... Xingjiao Li; Jianshe Liu; Yike Zeng; Junwen Liang // Applied Physics Letters;10/25/1993, Vol. 63 Issue 17, p2345 

    Investigates the preparation of lead-zirconate-titanate thin films on platinum-coated (111)silicon by reactive sputtering technique. Reaction products identified by x-ray diffraction; Diffraction patterns of the films; Remanent polarization of the ferroelectric hysteresis loops.

  • Biaxially aligned buffer layers of cerium oxide, yttria stabilized zirconia, and their bilayers. Gnanarajan, S.; Katsaros, A. // Applied Physics Letters;5/26/1997, Vol. 70 Issue 21, p2816 

    Examines the deposition of biaxially aligned cerium oxide and yttria stabilized zirconia thin films on nickel-based metal substrates. Use of ion beam assisted magnetron deposition; Achievement of room temperature epitaxial growth by bias sputtering; Investigation of crystalline structure and...

  • Capacitance–voltage characteristics of NaNbO[sub 3] thin films. Lingwar, Vijendra; Panwar, N. S. // Journal of Applied Physics;10/1/2003, Vol. 94 Issue 7, p4571 

    By radio-frequency magnetron sputtering of bulk NaNbO[sub 3] pellet targets, films of NaNbO[sub 3] have been deposited on silicon substrates at different temperatures. Room-temperature deposited films have been annealed at different temperatures. Film samples have been characterized using an...

  • Characterization of heat-treated CN films fabricated by dual-facing-target sputtering for soft X-ray multilayer mirrors. Bai, H.L.; Jiang, E.Y.; Wu, P.; Lou, Z.D.; Wang, Y.; Wang, C.D. // Applied Physics A: Materials Science & Processing;1999, Vol. 69 Issue 6, p641 

    Abstract. The structural characterization of heat-treated CN films fabricated by dual-facing-target sputtering for soft X-ray multilayer mirrors was performed by means of X-ray diffraction (XRD), Raman spectroscopy (RS) and X-ray photoelectron spectroscopy (XPS). The XRD analyses indicate a...

  • In situ x-ray diffraction studies of YBa2Cu3Ox. Williams, S.; Zheng, J. Q.; Shih, M. C.; Wang, X. K.; Lee, S. J.; Rippert, E. D.; Maglic, S.; Kajiyama, Hiroshi; Segel, D.; Dutta, P.; Chang, R. P. H.; Ketterson, J. B.; Roberts, T.; Lin, Y.; Kampwirth, R. T.; Gray, K. // Journal of Applied Physics;11/15/1992, Vol. 72 Issue 10, p4798 

    Deals with a study which examined in situ x-ray diffraction studies of the growth of thin films using a synchrotron light source. Information on an off-axis faced magnetron sputtering chamber; Methodology of the study; Results and discussion.

  • Effect of nitridation on magnetic properties of Fe[sub 53]Pt[sub 47] thin film. Hsiao, H. H.; Panda, R. N.; Shih, J. C.; Chin, T. S. // Journal of Applied Physics;3/1/2002, Vol. 91 Issue 5, p3145 

    The Fe[sub 53]Pt[sub 47] thin films with varying thickness were prepared using dc magnetron sputtering at various substrate temperatures (i.e., from 250 to 600 °C) on to CrMo seeded glass substrates. The powder x-ray diffraction studies reveal that the ordered fct γ[sub 2]-FePt phase...

  • TILT c AXIS CRYSTALLITE GROWTH OF ALUMINIUM NITRIDE FILMS BY REACTIVE RF-MAGNETRON SPUTTERING. Stan, G. E.; Pasuk, I.; Trinca, L. M.; Galca, A. C.; Enculescu, M.; Miculescu, F. // Digest Journal of Nanomaterials & Biostructures (DJNB);Jan-Mar2012, Vol. 7 Issue 1, p41 

    The article reports on the tilted growth of textured aluminium nitride thin films obtained by radio-frequency magnetron sputtering onto 50 mm diameter Si (111) wafers, in reactive atmosphere, in a planar sputtering system without tilting the substrate and with no additional sputtering geometry...

  • Relation between optical property and crystallinity of ZnO thin films prepared by rf magnetron sputtering. Takada, Syuichi // Journal of Applied Physics;5/15/1993, Vol. 73 Issue 10, p4739 

    Reports on the preparation of zinc oxide (ZnO) thin films using radio frequency (rf) magnetron sputtering on a SiO[sub2]/silicon substrate. Diagram of the rf magnetron sputtering system used; X-ray diffraction patterns of ZnO films prepared at various substrate temperatures; Substrate...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics