Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor

Watanabe, Hiroyuki; Manabe, Chikara; Shigematsu, Taishi; Shimizu, Masaaki
May 2001
Applied Physics Letters;5/7/2001, Vol. 78 Issue 19, p2928
Academic Journal
We have constructed a dual-probe scanning tunneling microscope (D-STM). We used multiwall carbon nanotubes [(NT), diameter: ∼10 nm] as STM probes. The D-STM allows us to elucidate the electric property of a sample with a spatial resolution of ∼1 nm. Using this system, we have measured the current-voltage curves of a single NT ring as a transistor. The curves show the possibility of nanometer-scale electronic circuits composed of NT devices. © 2001 American Institute of Physics.


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