Analysis of tip-sample interaction in tapping-mode atomic force microscope using an electrical circuit simulator

Sahin, O.; Atalar, A.
May 2001
Applied Physics Letters;5/7/2001, Vol. 78 Issue 19, p2973
Academic Journal
We present a mechanical model for the atomic force microscope tip tapping on a sample. The model treats the tip as a forced oscillator and the sample as an elastic material with adhesive properties. It is possible to transform the model into an electrical circuit, which offers a way of simulating the problem with an electrical circuit simulator. Also, the model predicts the energy dissipation during the tip-sample interaction. We briefly discuss the model and give some simulation results to promote an understanding of energy dissipation in a tapping mode. © 2001 American Institute of Physics.


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