All Ya-Ba-Cu-O c-axis trilayer interface-engineered Josephson junctions

Moeckly, B. H.
February 2001
Applied Physics Letters;2/5/2001, Vol. 78 Issue 6, p790
Academic Journal
We demonstrate the fabrication of c-axis YBCO trilayer Josephson junctions incorporating an engineered interface as the barrier layer. These devices display resistively shunted junction-like I-V characteristics with I[sub c]R[sub n] products >1 mV at 4.2 K and ∼100 μV at 60 K. © 2001 American Institute of Physics.


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