Refraction contrast imaging with a scanning microlens

Fletcher, D. A.; Crozier, K. B.; Quate, C. F.; Kino, G. S.; Goodson, K. E.; Simanovskii, D.; Palanker, D. V.
June 2001
Applied Physics Letters;6/4/2001, Vol. 78 Issue 23, p3589
Academic Journal
We demonstrate subwavelength spatial resolution with a scanning microlens operating in collection mode with a large-area detector. Optical contrast is created by refraction of off-axis light rays at angles larger than the maximum collection angle. With a microfabricated silicon microlens 10 μm in diameter, we measure spatial resolution due to refraction contrast of λ/4.3 at a wavelength of λ=10.7 μm. A model based on ray tracing is developed to explain our result, and we show that lens diameter and index of refraction limit resolution for large emission and collection angles. © 2001 American Institute of Physics.


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