Step towards sum frequency generation spectromicroscopy at a submicronic spatial resolution

Humbert, B.; Grausem, J.; Burneau, A.; Spajer, M.; Tadjeddine, A.
January 2001
Applied Physics Letters;1/1/2001, Vol. 78 Issue 1, p135
Academic Journal
A near-field optical device has been developed to collect sum frequency signal, generated in an AsGa single crystal sample by two pulsed lasers, one fixed at a wavelength of 532 nm and the other tunable in midinfrared. The sum frequency signal was collected with an uncoated silica tip. When the tip sample distance was increased, a strong decrease of the collected sum frequency signal was observed: the signal was divided by 2 for an increase of about 100 nm of the distance between the nanoprobe end and the sample surface. Without demonstrating submicronic lateral spatial resolution, this letter is, however, a first step towards a microscopic device of sum frequency generation spectroscopy. © 2001 American Institute of Physics.


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