Depth resolved luminescence from oriented ZnO nanowires

Rosenberg, R. A.; Abu Haija, M.; Vijayalakshmi, K.; Zhou, J.; Xu, S.; Wang, Z. L.
December 2009
Applied Physics Letters;12/14/2009, Vol. 95 Issue 24, p243101
Academic Journal
We have utilized the limited penetration depth of x-rays to study the near-surface properties of vertically aligned ZnO nanowires. For an energy of 600 eV the penetration depth varies between 3 and 132 nm as the incidence angle changes from 2° to 33°. Thus, by obtaining optical luminescence spectra as a function of incidence angle, it is possible to probe the near-surface region with nanometer-scale resolution. We will present angle dependent optical luminescence data from oriented ZnO nanowires. By fitting the results to a simple model, we extract a depth for the surface defect regions of ∼14 nm.


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