TITLE

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

AUTHOR(S)
Kwang-Hee Lee; Ji Sim Jung; Kyoung Seok Son; Joon Seok Park; Tae Sang Kim; Choi, Rino; Jae Kyeong Jeong; Jang-Yeon Kwon; Bonwon Koo; Sangyun Lee
PUB. DATE
December 2009
SOURCE
Applied Physics Letters;12/7/2009, Vol. 95 Issue 23, p232106
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We investigated the impact of photon irradiation on the stability of gallium-indium-zinc oxide (GIZO) thin film transistors. The application of light on the negative bias temperature stress (NBTS) accelerated the negative displacement of the threshold voltage (Vth). This phenomenon can be attributed to the trapping of the photon-induced carriers into the gate dielectric/channel interface or the gate dielectric bulk. Interestingly, the negative Vth shift under photon-enhanced NBTS condition worsened in relatively humid environments. It is suggested that moisture is a significant parameter that induces the degradation of bias-stressed GIZO transistors.
ACCESSION #
46708388

 

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