The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy

Lee, N. J.; Yoo, J. W.; Choi, Y. J.; Kang, C. J.; Jeon, D. Y.; Kim, D. C.; Seo, S.; Chung, H. J.
November 2009
Applied Physics Letters;11/30/2009, Vol. 95 Issue 22, p222107
Academic Journal
We report on the interlayer screening effect of graphene using Kelvin probe force microscopy (KPFM). By using a gate device configuration that enables the supply of electronic carriers in graphene sheets, the vertical screening properties were studied from measuring the surface potential gradient. The results show layer-dependence of graphene sheets, as the number of graphene layers increases, the surface potential decreases exponentially. In addition, we calculate the work function-related information of the graphene layers using KPFM.


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