Extended depth of focus in a particle field measurement using a single-shot digital hologram

Chen, Wen; Quan, Chenggen; Tay, Cho Jui
November 2009
Applied Physics Letters;11/16/2009, Vol. 95 Issue 20, p201103
Academic Journal
We propose a method to extend the depth of focus in a particle field measurement using a single-shot digital hologram. A focal plane is obtained for each pixel based on an entropy method, and a depth map is subsequently extracted. A synthesized extended focused image is determined correspondingly using the extracted depth map. In addition, a wavelet modulus maxima algorithm and Canny algorithm are further employed to detect the edges of each particle, and the sizes and a three-dimensional localization of the particles are also estimated. Preliminary results are presented to show the feasibility and effectiveness of the proposed technique.


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