TITLE

Combined elemental analysis of ancient glass beads by means of ion beam, portable XRF, and EPMA techniques

AUTHOR(S)
Sokaras, D.; Karydas, A. G.; Oikonomou, A.; Zacharias, N.; Beltsios, K.; Kantarelou, V.
PUB. DATE
December 2009
SOURCE
Analytical & Bioanalytical Chemistry;Dec2009, Vol. 395 Issue 7, p2199
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Ion beam analysis (IBA)- and X-ray fluorescence (XRF)-based techniques have been well adopted in cultural-heritage-related analytical studies covering a wide range of diagnostic role, i.e., from screening purposes up to full quantitative characterization. In this work, a systematic research was carried out towards the identification and evaluation of the advantages and the limitations of laboratory-based (IBA, electron probe microanalyzer) and portable (milli-XRF and micro-XRF) techniques. The study focused on the analysis of an Archaic glass bead collection recently excavated from the city of Thebes (mainland, Greece), in order to suggest an optimized and synergistic analytical methodology for similar studies and to assess the reliability of the quantification procedure of analyses conducted in particular by portable XRF spectrometers. All the employed analytical techniques and methodologies proved efficient to provide in a consistent way characterization of the glass bead composition, with analytical range and sensitivity depending on the particular technique. The obtained compositional data suggest a solid basis for the understanding of the main technological features related to the raw major and minor materials utilized for the manufacture of the Thebian ancient glass bead collection.
ACCESSION #
45362973

 

Related Articles

  • Low energy ion beam mixing as a tool for multilayer x-ray mirror fabrication. Schlatmann, R.; Keppel, A. // Applied Physics Letters;5/20/1996, Vol. 68 Issue 21, p2948 

    Evaluates low energy ion beam mixing as a tool for multilayer X-ray mirror fabrication. Creation of a stack of alternating layers of silicon and Mo[sub x]Si[sub x]; Measurement of composition and interfacial roughness; Reduction of absorption losses in X-ray multilayer mirrors.

  • X-ray-induced fluorescence spectroscopy with highly charged ion beam produced by a laser ion source. Ozawa, S.; Wakasugi, M.; Okamura, M.; Katayama, T.; Koizumi, T.; Serata, M. // Review of Scientific Instruments;May2004, Vol. 75 Issue 5, p1579 

    We designed and tested a beam line for transport of highly charged ions produced by a laser ion source. The ion beam is prepared for an x-ray spectroscopy experiment based on a laser-induced fluorescence spectroscopy. A C4+ beam which has a peak current of 160 μA and bunch width of 500 ns was...

  • Multilayers quantitative X-ray fluorescence analysis applied to easel paintings. De Viguerie, Laurence; Sole, V. Armando; Walter, Philippe // Analytical & Bioanalytical Chemistry;Dec2009, Vol. 395 Issue 7, p2015 

    X-ray fluorescence spectrometry (XRF) allows a rapid and simple determination of the elemental composition of a material. As a non-destructive tool, it has been extensively used for analysis in art and archaeology since the early 1970s. Whereas it is commonly used for qualitative analysis,...

  • Microtextures, microchemistry, and mineralogy of basaltic glass alteration, Jeju Island, Korea, with implications for elemental behavior. GI YOUNG JEONG; YOUNG KWAN SOHN // American Mineralogist;Jul2011, Vol. 96 Issue 7, p1129 

    The meteoric alteration of basaltic glass in hyaloclastite (0.55 to 0.2 Ma) from Jeju Island, Korea, was examined using high-resolution electron microscopy, in situ sample preparation using focused ion beam, and microchemical analysis. The glass particles showed a sequential development of...

  • Initial stages of the ion beam mixing process. Traverse, A.; Le Boité, M. G.; Névot, L.; Pardo, B.; Corno, J. // Applied Physics Letters;12/7/1987, Vol. 51 Issue 23, p1901 

    The grazing x-ray reflectometry technique, performed on irradiated periodic multilayers, was used to study the early stages of the ion beam mixing process. We present our first results, obtained on NiAu samples irradiated with He ions. The experimental fluence dependence of the effective...

  • Oxygen ion beam-induced abnormal surface topographic development at Ta/Si interface. Kim, Kyung Joong; Jung, Kyung-Hoon; Moon, Dae Won // Applied Physics Letters;10/21/1996, Vol. 69 Issue 17, p2483 

    We report on an abnormal surface topographic development at a Ta/Si interface, which is believed to be one of the major sources of the irregular interface artifacts in secondary ion mass spectrometry depth profiling by oxygen ion beam. Round crater type topographic development was observed at...

  • Ion bombardment of thin layers: The effect on the interface roughness and its x-ray reflectivity (invited). Puik, E. J.; van der Wiel, M. J.; Zeijlemaker, H.; Verhoeven, J. // Review of Scientific Instruments;Jan1992, Vol. 63 Issue 1, p1415 

    In this paper we report on experiments which indicate the necessity of the use of ion-beam bombardment for e-beam deposited multilayer x-ray coatings. Measurements are described in which ion bombardment (200-300 eV Ar[sup +] ) is used to ion etch metal layers after initial deposition and during...

  • Rotational-temperature evolution of a N[sub 2][sup +] ion beam in a storage ring probed by laser induced fluorescence spectroscopy. Rose´n, Stefan; Larsson, Mats; Royen, Peder; Rostohar, Danijela; Lidberg, Johan; Mannervik, Sven; Shi, Wei // Review of Scientific Instruments;Nov2001, Vol. 72 Issue 11, p4300 

    Laser induced fluorescence spectroscopy has been applied for the first time on a stored fast molecular ion beam. The rotational temperature of the N[sub 2][sup +] ion beam was studied as a function of storage time. For up to 1 s of storage time, a temperature of 1040 K can be used to describe...

  • Detection limits of impurities in a light filler in an X-ray fluorescent arrangement with a secondary target. Mikhailov, I.; Baturin, A.; Mikhailov, A.; Fomina, L. // Instruments & Experimental Techniques;Jul2012, Vol. 55 Issue 4, p490 

    The application of the arrangement with a secondary target for the X-ray fluorescent analysis of microimpurities in water solutions without sample destructions and preliminary sample preparations is considered. The limiting contrast values of fluorescence spectra are estimated, the limits of...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics