Sulfur passivation of InN surface electron accumulation

Bailey, L. R.; Veal, T. D.; Kendrick, C. E.; Durbin, S. M.; McConville, C. F.
November 2009
Applied Physics Letters;11/9/2009, Vol. 95 Issue 19, p192111
Academic Journal
The effects of treatment with ammonium sulfide ((NH4)2Sx) solution on the electronic properties of InN surfaces have been investigated with high resolution x-ray photoemission spectroscopy. The valence band, In 3d, and N 1s x-ray photoemission spectra show that the surface Fermi level decreases by approximately 0.15 eV with (NH4)2Sx-treatment. This corresponds to a reduction of the downward band bending with the surface sheet charge density decreasing by 30%.


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