TITLE

Sulfur passivation of InN surface electron accumulation

AUTHOR(S)
Bailey, L. R.; Veal, T. D.; Kendrick, C. E.; Durbin, S. M.; McConville, C. F.
PUB. DATE
November 2009
SOURCE
Applied Physics Letters;11/9/2009, Vol. 95 Issue 19, p192111
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The effects of treatment with ammonium sulfide ((NH4)2Sx) solution on the electronic properties of InN surfaces have been investigated with high resolution x-ray photoemission spectroscopy. The valence band, In 3d, and N 1s x-ray photoemission spectra show that the surface Fermi level decreases by approximately 0.15 eV with (NH4)2Sx-treatment. This corresponds to a reduction of the downward band bending with the surface sheet charge density decreasing by 30%.
ACCESSION #
45249160

 

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