Large excess volume in grain boundaries of stressed, nanocrystalline metallic thin films: Its effect on grain-growth kinetics

Kuru, Y.; Wohlschlögel, M.; Welzel, U.; Mittemeijer, E. J.
October 2009
Applied Physics Letters;10/19/2009, Vol. 95 Issue 16, p163112
Academic Journal
The excess volumes per unit grain-boundary area of nanocrystalline Pd and Ni thin films were measured by an efficacious method based on real time in situ x-ray diffraction measurements. The obtained large values for the grain-boundary excess volume reveal the background of surprising, yet unexplained observations of grain growth in nanocrystalline materials.


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