Role of copper in light induced minority-carrier lifetime degradation of silicon

Savin, H.; Yli-Koski, M.; Haarahiltunen, A.
October 2009
Applied Physics Letters;10/12/2009, Vol. 95 Issue 15, p152111
Academic Journal
We investigate the impact of copper on the light induced minority-carrier lifetime degradation in various crystalline silicon materials. We demonstrate here that the presence of neither boron nor oxygen is necessary for the degradation effect. In addition, our experiments reveal that copper contamination alone can cause the light induced minority-carrier lifetime degradation.


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