TITLE

Si clusters on reconstructed SiC (0001) revealed by surface extended x-ray absorption fine structure

AUTHOR(S)
Xingyu Gao; Shi Chen; Tao Liu; Wei Chen; Wee, A. T. S.; Nomoto, T.; Yagi, S.; Soda, Kazuo; Yuhara, Junji
PUB. DATE
October 2009
SOURCE
Applied Physics Letters;10/5/2009, Vol. 95 Issue 14, p144102
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The evolution of silicon carbide (0001) surface reconstruction upon annealing has been studied by Si K edge extended x-ray absorption fine structure (EXAFS). Using Si KVV Auger electron yield at different emission angles with different surface sensitivities, EXAFS reveals conclusively that Si–Si bonds exist on the surface for all reconstructions. The existence of Si clusters on the 63×63R30° surface was also confirmed by x-ray photoemission spectroscopy. This finding gives us a better understanding of epitaxial graphene formation on SiC.
ACCESSION #
44539733

 

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