TITLE

Azimuth dependent reflection anisotropy of oriented thin films

AUTHOR(S)
Lane, P. D.; Isted, G. E.; Roseburgh, D. S.; Cole, R. J.
PUB. DATE
October 2009
SOURCE
Applied Physics Letters;10/5/2009, Vol. 95 Issue 14, p141907
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A simplified mathematical description of reflection anisotropy spectroscopy (RAS) measurements is presented. The RAS signals of a nanometer film with arbitrarily aligned dielectric axes are investigated. While RAS spectra are found to be relatively insensitive to tilting of the dielectric axes out of the surface plane, the variation of RAS signals with sample azimuthal orientation angle, θs, reveals a distinct sin θs effect, superimposed on the previously observed sin 2θs and sin 4θs terms, which provides a measure of the tilt angle.
ACCESSION #
44539705

 

Related Articles

  • Spin polarization of currents in Co/Pt multilayer and Co–Pt alloy thin films. Rajanikanth, A.; Kasai, S.; Ohshima, N.; Hono, K. // Applied Physics Letters;7/12/2010, Vol. 97 Issue 2, p022505 

    The point contact Andreev reflection technique was employed to estimate the spin polarization of currents in Co/Pt multilayered thin film and Co–Pt alloy film with perpendicular anisotropy. The spin polarization of currents in the Co–Pt alloy film was estimated to be 0.48, while...

  • Writing polarization bits on the multiferroic BiMnO3 thin film using Kelvin probe force microscope. Son, J. Y.; Kim, Bog G.; Kim, C. H.; Cho, J. H. // Applied Physics Letters;6/14/2004, Vol. 84 Issue 24, p4971 

    We report the multiferroic properties of epitaxially (100) oriented BiMnO3 thin film on (100) LaAlO3 substrate and preferentially (111) oriented BiMnO3 thin film on (111) Pt/TiO2/SiO2/Si substrate. Nano-size bits of ferroelectric polarization on the BiMnO3 thin film on (111) Pt/TiO2/SiO2/Si...

  • Strain relaxation in epitaxial (Pb,Sr)TiO3 thin films on NdGaO3 substrates. Lin, Y.; Dai, C.; Li, Y. R.; Chen, X.; Chen, C. L.; Bhalla, A.; Jia, Q. X. // Applied Physics Letters;3/8/2010, Vol. 96 Issue 10, p102901 

    Strain relaxation behavior of (Pb,Sr)TiO3 thin films on (110) NdGaO3 substrates fabricated under different conditions have been investigated using high resolution x-ray diffraction. Dislocation densities and interfacial strain distribution have been systematically studied with samples in...

  • Limits of strain relaxation in InGaAs/GaAs probed in real time by in situ wafer curvature measurement. Lynch, C.; Chason, E.; Beresford, R.; Freund, L. B.; Tetz, K.; Schwarz, K. W. // Journal of Applied Physics;10/1/2005, Vol. 98 Issue 7, p073532 

    In situ stress measurements during molecular-beam epitaxy growth of InxGa1-xAs/GaAs provide insight into the relaxation behavior of thin films grown on mismatched substrates. Strain relaxation in the materials studied occurs due to the formation and glide of dislocations. Measurements of...

  • Simulation of interface dislocations effect on polarization distribution of ferroelectric thin films. Yue Zheng; Biao Wang; Woo, C. H. // Applied Physics Letters;2/27/2006, Vol. 88 Issue 9, p092903 

    Effects of interfacial dislocations on the properties of ferroelectric thin films are investigated, using the dynamic Ginzburg–Landau equation. Our results confirm the existence of a dead layer near the film/substrate interface. Due to the combined effects of the dislocations and the...

  • Influence of strain on the dielectric relaxation of pyrochlore bismuth zinc niobate thin films. Jiwei Lu; Klenov, Dmitri O.; Stemmer, Susanne // Applied Physics Letters;2/9/2004, Vol. 84 Issue 6, p957 

    Bi[sub 1.5]Zn[sub 1.0]Nb[sub 1.5]O[sub 7] (BZN) films were deposited by rf magnetron sputtering on different substrates to systematically vary the film stress due the thermal mismatch between BZN and the substrate. Substrates included Pt/SiO[sub 2] covered silicon, vycor glass, magnesium oxide,...

  • Strain relaxation of epitaxial (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 thin films grown on SrTiO3 substrates by pulsed laser deposition. Vayunandana Reddy, Y. K.; Wolfman, Jérôme; Autret-Lambert, Cécile; Gervais, Monique; Gervais, François // Journal of Applied Physics;Jun2010, Vol. 107 Issue 10, p106101 

    High crystalline quality (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 (BSTZ) thin films were epitaxially grown by pulsed laser deposition on (001) SrTiO3 single crystal substrates. Their epitaxial nature was revealed by x-ray and electron diffraction. Thinnest film (∼9 nm) has largest out-of-plane lattice...

  • Temperature-dependent fatigue behaviors of ferroelectric Pb(Zr0.52Ti0.48)O3 and Pb0.75La0.25TiO3 thin films. Liu, J.-M.; Wang, Y.; Zhu, C.; Yuan, G. L.; Zhang, S. T. // Applied Physics Letters;7/25/2005, Vol. 87 Issue 4, p042904 

    The polarization switching fatigue of ABO3-perovskite ferroelectric thin-film Pb(Zr0.52Ti0.48)O3 (PZT) prepared by metalorganic decomposition (MOD) and Pb0.75La0.25TiO3 (PLT) prepared by pulsed laser deposition (PLD), are investigated. The temperature as a degree of freedom is employed to...

  • Five layer narrow band position variable filters for sharp colours and ultra low emittance. Gentle, A. R.; Smith, G. B. // Applied Physics B: Lasers & Optics;Jul2008, Vol. 92 Issue 1, p67 

    A simplified approach to creating narrow visible and near IR transmission bands with thin films is outlined utilising just five layers on glass, three of which are thin silver. These films have very high reflection at most wavelengths except for a narrow anti-reflection band where reflectance...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics