Azimuth dependent reflection anisotropy of oriented thin films

Lane, P. D.; Isted, G. E.; Roseburgh, D. S.; Cole, R. J.
October 2009
Applied Physics Letters;10/5/2009, Vol. 95 Issue 14, p141907
Academic Journal
A simplified mathematical description of reflection anisotropy spectroscopy (RAS) measurements is presented. The RAS signals of a nanometer film with arbitrarily aligned dielectric axes are investigated. While RAS spectra are found to be relatively insensitive to tilting of the dielectric axes out of the surface plane, the variation of RAS signals with sample azimuthal orientation angle, θs, reveals a distinct sin θs effect, superimposed on the previously observed sin 2θs and sin 4θs terms, which provides a measure of the tilt angle.


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