Surface structure and chemical states of a-plane and c-plane InN films

Nagata, Takahiro; Koblmüller, Gregor; Bierwagen, Oliver; Gallinat, Chad S.; Speck, James S.
September 2009
Applied Physics Letters;9/28/2009, Vol. 95 Issue 13, p132104
Academic Journal
The surface electron accumulation layer, surface structure, and surface chemical states of a-plane (nonpolar) and c-plane (polar) InN epitaxial films were investigated. Electrical measurements indicated electron accumulation layers on the surface of both the InN films. Angle-resolved x-ray photoelectron spectroscopy (XPS) measurements indicated a strong band bending at both surfaces, thus confirming the surface electron accumulation. Further XPS analysis of the near-surface chemical states indicated an In adlayer at the surface of c-plane InN and an oxygen adsorbed layer on the a-plane InN. These results suggest different ad-layers to cause the surface electron accumulation on c-plane and a-plane InN.


Related Articles

  • Effects of different kinds of seed layers and heat treatment on adhesion characteristics of Cu/(Cr or Ni-Cr)/PI interfaces in flexible printed circuits. Bo-In Noh; Jeong-Won Yoon; Bo-Young Lee; Seung-Boo Jung // Journal of Materials Science: Materials in Electronics;Jul2011, Vol. 22 Issue 7, p790 

    In this study, the effect of various seed layers (95Ni-5Cr, 80Ni-20Cr and Cr) on the adhesion strength of flexible copper clad laminate (FCCL), which was manufactured by the roll-to-roll process, was evaluated after heat treatment. The changes in the morphology, chemical bonding, and adhesion...

  • A New Organofunctional Ethoxysilane Self-Assembly Monolayer for Promoting Adhesion of Rubber to Aluminum. Fang Wang; Juan Xu; Heyi Luo; Jinggang Wang; Qian Wang // Molecules;Oct2009, Vol. 14 Issue 10, p4087 

    Practical adhesion of rubber to aluminum is measured for various aluminum silanization treatments. In this study, 6-(3-triethoxysilylpropylamino)-1,3,5-triazine-2,4- dithiol (TES) was used as the coupling agent for preparing self-assembly monolayers (SAMs) on an aluminum surface. The structure...

  • Atomic force microscopy and X-ray photoelectron spectroscopy study of chitosan-carbon fiber materials. Nikolenko, Yu. M.; Kuryavyi, V. G.; Sheveleva, I. V.; Zemskova, L. A.; Sergienko, V. I. // Inorganic Materials;Mar2010, Vol. 46 Issue 3, p221 

    Chitosan-carbon materials produced by electrochemical deposition of chitosan on an activated carbon fiber (ACF) as an electrode have been studied by atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). AFM data demonstrate that the microstructure of the coating depends on...

  • A STUDY ON SURFACE CHARACTERIZATION OF ENZYME TREATED POLYETHYLENE TEREPHTHALATE FIBERS BY XPS AND AFM. KARACA, Burcu; ÖZDOĞAN, Esen // Journal of Textile & Apparel / Tekstil ve Konfeksiyon;Jan-Mar2013, Vol. 23 Issue 1, p16 

    Polyesters are widely used in various industrial applications and preferred for their outstanding properties such as high strength, resistance to abrasion, shrinking, wrinkling, most of the chemicals and environmental conditions. However the hydrophobic surface structure due to the lack of polar...

  • Shear Behavior of Glass Fabric/Epoxy Resin Composite Prepared by Surface Treatments. Yaman, Necla; Senol, M. Fikri // AATCC Review;Mar/Apr2012, Vol. 12 Issue 2, p69 

    Unsized glass fabrics were subjected to low temperature plasma or silane coupling to modify the fiber and thus influence the interphase properties of the glass/epoxy system. Orthogonal Array Testing Strategy was used for determining optimal treatment conditions. Tetraethylorthosilicate was...

  • Determination of modified-layer thickness of glow-discharge-treated polytetrafluoroethylene film. Yablokov, M.; Sokolov, I.; Malinovskaya, O.; Gil'man, A.; Kuznetsov, A. // High Energy Chemistry;Jan2013, Vol. 47 Issue 1, p32 

    The article presents a study which experimentally measured the thickness of the modified layer in a dc discharge-treated polytetrafluoroethylene (PTFE) film. A combination of X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) techniques was used to measure the thickness....

  • Novel Approach to Surface Processing for Improving the Efficiency of CdZnTe Detectors. Hossain, A.; Bolotnikov, A.; Camarda, G.; Cui, Y.; Jones, D.; Hall, J.; Kim, K.; Mwathi, J.; Tong, X.; Yang, G.; James, R. // Journal of Electronic Materials;Aug2014, Vol. 43 Issue 8, p2771 

    We emphasize an improvement of the surface processing procedures for cadmium zinc telluride (CZT) detectors, which is one of the principal problems limiting the technology. A rough surface enhances the leakage current into the medium, creating additional trapping centers and thereby degrading...

  • Modification of 4H-SiC and 6H-SiC(0001)Si Surfaces through the Interaction with Atomic Hydrogen and Nitrogen. Losurdo, Maria; Giangregorio, Maria M.; Capezzuto, Pio; Bruno, Giovanni; Brown, April S.; Tong-Ho Kim; Changhyun Yi // Journal of Electronic Materials;Apr2005, Vol. 34 Issue 4, p457 

    The interaction of 4H-SiC(0001)Si and 6H-SiC(0001)Si surfaces with atomic hydrogen and atomic nitrogen produced by remote radio-frequency plasmas is investigated. The kinetics of the surface modifications is monitored in real time using ellipsometry, while chemical modifications of the surface...

  • The influence of nanoscopically thin silver films on bacterial viability and attachment. Ivanova, Elena P.; Hasan, Jafar; Truong, Vi Khanh; Wang, James Y.; Raveggi, Massimo; Fluke, Christopher; Crawford, Russell J. // Applied Microbiology & Biotechnology;Aug2011, Vol. 91 Issue 4, p1149 

    The physicochemical and bactericidal properties of thin silver films have been analysed. Silver films of 3 and 150 nm thicknesses were fabricated using a magnetron sputtering thin-film deposition system. X-ray photoelectron and energy dispersive X-ray spectroscopy and atomic force microscopy...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics