A Seeman–Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials

Milathianaki, D.; Hawreliak, J.; McNaney, J. M.; El-Dasher, B. S.; Saculla, M. D.; Swift, D. C.; Lorenzana, H. E.; Ditmire, T.
September 2009
Review of Scientific Instruments;Sep2009, Vol. 80 Issue 9, p093904
Academic Journal
We report on a focusing x-ray diffraction geometry capable of high-resolution in situ lattice probing from dynamically loaded polycrystalline and amorphous materials. The Seeman–Bohlin-type camera presented here is ideally suited for time-resolved x-ray diffraction measurements performed on high energy multibeam laser platforms. Diffraction from several lattice planes of ablatively shock-loaded 25 μm thick Cu foils was recorded on a focusing circle of diameter D=100 mm with exceptional angular resolution limited only by the spectral broadening of the x-ray source. Excellent agreement was found between the density measured using x-ray diffraction and that inferred from Doppler velocimetry and the known shock Hugoniot of Cu. In addition, x-ray diffraction signal was captured from an amorphous material under static conditions.


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