TITLE

Nanoscale optical tomography using volume-scanning near-field microscopy

AUTHOR(S)
Jin Sun; Schotland, John C.; Hillenbrand, Rainer; Carney, P. Scott
PUB. DATE
September 2009
SOURCE
Applied Physics Letters;9/21/2009, Vol. 95 Issue 12, p121108
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.
ACCESSION #
44374763

 

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