Nanoscale optical tomography using volume-scanning near-field microscopy

Jin Sun; Schotland, John C.; Hillenbrand, Rainer; Carney, P. Scott
September 2009
Applied Physics Letters;9/21/2009, Vol. 95 Issue 12, p121108
Academic Journal
The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.


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