TITLE

In-depth resolved Raman scattering analysis of secondary phases in Cu-poor CuInSe2 based thin films

AUTHOR(S)
Fontané, X.; Izquierdo-Roca, V.; Calvo-Barrio, L.; Álvarez-Garcia, J.; Pérez-Rodríguez, A.; Morante, J. R.; Witte, W.
PUB. DATE
September 2009
SOURCE
Applied Physics Letters;9/21/2009, Vol. 95 Issue 12, p121907
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Raman scattering analysis of Cu-poor CuInSe2 layers shows the coexistence of the ordered vacancy compound (OVC), CuAu–CuInSe2 and chalcopyrite (CH) CuInSe2 phases as function of the Cu/In content ratio x. In-depth resolved measurements from layers with x≤0.57 show a strong inhibition in the relative intensity of the CH-CuInSe2 mode at the back region. Micro-Raman spectra directly measured at different regions from the layers with 0.66≤x≤0.71 also suggest a higher content of the OVC phase at this back region. These data suggest an enhancement in the formation of OVC at this region in the layers.
ACCESSION #
44374738

 

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