Optical gate action of a molecular thin film probed with femtosecond near-field optical microscopy

Kawashima, H.; Furuki, M.; Tatsuura, S.; Tian, M.; Sato, Y.; Pu, L. S.; Tani, T.
August 2000
Applied Physics Letters;8/28/2000, Vol. 77 Issue 9
Academic Journal
We have combined a near-field scanning optical microscope with a two-color time-resolved pump-probe measurement system. The sample was a molecular thin film that revealed an excitonic resonance and also had a characteristic domain structure. The measurement system has a noise-equivalent transmittance change as small as 5.0x10[sup -5] for a probe pulse with an intensity of 30 nW, which allows us to detect an optical gate action of a single domain. The results suggest that the film composition is uniform over a distance of several microns while it may vary on a greater scale. © 2000 American Institute of Physics.


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