Electron tunneling detected by electrostatic force

Klein, L. J.; Klein, L.J.; Williams, C. C.; Williams, C.C.; Kim, J.
November 2000
Applied Physics Letters;11/27/2000, Vol. 77 Issue 22
Academic Journal
A method is introduced for measuring the tunneling of electrons between a specially fabricated scanning probe microscope tip and a surface. The technique is based upon electrostatic force detection of charge as it is transferred to and from a small (10[sup -17] F) electrically isolated metallic dot on the scanning probe tip. The methods for dot fabrication, charging, and discharging are described and electron tunneling to a sample surface is demonstrated. © 2000 American Institute of Physics.


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